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Overview_x000D_ A range of miniature photoelectric sensors with Best in Class features. The brand new PinPoint and ASIC technologies used offer the safest detection of all objects, and therefore also of transparent and reflective objects such as blisters, electronic cards and cans. Optical axes on the flat face allow easy and space-saving integration into the machine environment, even without a mounting bracket._x000D_ At a glance_x000D_ Best-in-class background suppression detector_x000D_ Use of PinPoint technology in all models_x000D_ Background elimination detector with a laser-like light spot for precise detection tasks_x000D_ Reliable adjustment using 5-turn potentiometer, teach button, teach-in by cable or IO-Link_x000D_ Easy sensor settings, monitoring, extended diagnostics and visualization via IO-Link_x000D_ Your Benefit_x000D_ Economical integration into a machine even in tight spaces_x000D_ Variety of applications thanks to reliable detection of shiny, transparent or very dark objects_x000D_ M3 metal thread inserts provide sturdy fastening ensuring long life_x000D_ High immunity to stray lights reduces erroneous switching and thus downtime_x000D_ The perfectly visible light spot makes it easy to align the sensor_x000D_ Easy access to data from a PLC via IO-Link_x000D_ Quick and easy setting_x000D_ Simple and fast integration thanks to function blocks_x000D_ Applications_x000D_ Reliable detection of irregularly shaped PCBs_x000D_ Empty bin detection_x000D_ Equidistant product feed_x000D_ Paper tear control_x000D_ Paper presence control_x000D_ Paper edge detection_x000D_ Front edge detection and presence control_x000D_ Sheet presence and cutting control_x000D_ Sheet presence and position control_x000D_ Presence control and counting procedure_x000D_ Preventing collisions at the machining table_x000D_ Material feed control_x000D_ Bin stack overflow control_x000D_ Checking the filling level in the coin hopper_x000D_ Detection of solar wafers in the harsh operating environment of wafer production_x000D_ Detection of solar wafers in the harsh operating environment of cell production_x000D_ Detection, measurement and positioning of the solar glass substrate_x000D_ Overload detection in vertical storage system_x000D_ Complete control of the state of charge by direct reflection detector integrated in the fork of the truck_x000D_ Note_x000D_ Product details cover the whole product family. For details on the specifications for this individual product, please refer to the datasheet.
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