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Overview_x000D_
A range of miniature photoelectric sensors with Best in Class features. The brand new PinPoint and ASIC technologies used offer the safest detection of all objects, and therefore also of transparent and reflective objects such as blisters, electronic cards and cans. Optical axes on the flat face allow easy and space-saving integration into the machine environment, even without a mounting bracket._x000D_
At a glance_x000D_
Best-in-class background suppression detector_x000D_
Use of PinPoint technology in all models_x000D_
Background elimination detector with a laser-like light spot for precise detection tasks_x000D_
Reliable adjustment using 5-turn potentiometer, teach button, teach-in by cable or IO-Link_x000D_
Easy sensor settings, monitoring, extended diagnostics and visualization via IO-Link_x000D_
Your Benefit_x000D_
Economical integration into a machine even in tight spaces_x000D_
Variety of applications thanks to reliable detection of shiny, transparent or very dark objects_x000D_
M3 metal thread inserts provide sturdy fastening ensuring long life_x000D_
High immunity to stray lights reduces erroneous switching and thus downtime_x000D_
The perfectly visible light spot makes it easy to align the sensor_x000D_
Easy access to data from a PLC via IO-Link_x000D_
Quick and easy setting_x000D_
Simple and fast integration thanks to function blocks_x000D_
Applications_x000D_
Reliable detection of irregularly shaped PCBs_x000D_
Empty bin detection_x000D_
Equidistant product feed_x000D_
Paper tear control_x000D_
Paper presence control_x000D_
Paper edge detection_x000D_
Front edge detection and presence control_x000D_
Sheet presence and cutting control_x000D_
Sheet presence and position control_x000D_
Presence control and counting procedure_x000D_
Preventing collisions at the machining table_x000D_
Material feed control_x000D_
Bin stack overflow control_x000D_
Checking the filling level in the coin hopper_x000D_
Detection of solar wafers in the harsh operating environment of wafer production_x000D_
Detection of solar wafers in the harsh operating environment of cell production_x000D_
Detection, measurement and positioning of the solar glass substrate_x000D_
Overload detection in vertical storage system_x000D_
Complete control of the state of charge by direct reflection detector integrated in the fork of the truck_x000D_
Note_x000D_
Product details cover the whole product family. For details on the specifications for this individual product, please refer to the datasheet.
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